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Semiconductor electronics: Trapped fast at the gate

โœ Scribed by Gelinck, Gerwin


Book ID
109814495
Publisher
Nature Publishing Group
Year
2007
Tongue
English
Weight
332 KB
Volume
445
Category
Article
ISSN
0028-0836

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This paper investigates the applicability of the proposed models for electron trap generation in gate oxides. It is found that neither the electron-hole recombination nor the high oxide field itself is the main source for the generation. Although the hole injection alone can generate traps, the elec