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Ligand-Localized Electron Trapping at Sensitized Semiconductor Interfaces

✍ Scribed by Hoertz, Paul G.; Thompson, David W.; Friedman, Lee A.; Meyer, Gerald J.


Book ID
126298306
Publisher
American Chemical Society
Year
2002
Tongue
English
Weight
70 KB
Volume
124
Category
Article
ISSN
0002-7863

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