Semiconductor drift detectors: applications and new devices

✍ Scribed by A. Castoldi; C. Fiorini; C. Guazzoni; A. Longoni; L. Strüder

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 225 KB
• Volume: 28
• Category: Article
• ISSN: 0049-8246
• DOI: 10.1002/(sici)1097-4539(199909/10)28:5<312::aid-xrs349>3.0.co;2-y

✦ Synopsis

Recent technological developments and new topology designs have made semiconductor drift detectors ideal devices for high-resolution x-ray spectrometry. In this paper the basic topology of a semiconductor drift detector with on-chip electronics specially designed for x-ray spectrometry is reviewed. These devices have been used for the first time in x-ray and g-ray spectroscopy applications. In particular, the results obtained in non-destructive analyses by using a EDXRF spectrometer based on a Peltier cooled semiconductor drift detector and in photodetection of scintillation light are reported. The working principle and the first experimental results for a novel position-sensitive x-ray detector with spectroscopic capability are presented.