Recent technological developments and new topology designs have made semiconductor drift detectors ideal devices for high-resolution x-ray spectrometry. In this paper the basic topology of a semiconductor drift detector with on-chip electronics specially designed for x-ray spectrometry is reviewed.
✦ LIBER ✦
Principle and applications of Controlled-Drift Detectors
✍ Scribed by A. Castoldi; C. Guazzoni; R. Hartmann; L. Strüder
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 365 KB
- Volume
- 579
- Category
- Article
- ISSN
- 0168-9002
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