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Semiconductor defects at the interface

✍ Scribed by Fabien Devynck; Alfredo Pasquarello

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 595 KB
Volume: 401-402
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2007.09.020

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