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Self-heating in BJT circuit parameter extraction

✍ Scribed by Michael Reisch


Book ID
103397091
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
224 KB
Volume
35
Category
Article
ISSN
0038-1101

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A new method of S-parameter extraction from the FDTD in analyses of microstrip circuits is proposed. It only uses the Ex-field component parts in three selected trans¨erse cross sections of the transmission line under approach. The reflection coefficient is extracted from a single run of the FDTD. N