𝔖 Bobbio Scriptorium
✦   LIBER   ✦

A new method of S-parameter extraction from the FDTD in analyses of microstrip circuit discontinuities

✍ Scribed by Zhiyuan Yu

Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
84 KB
Volume
16
Category
Article
ISSN
0895-2477

No coin nor oath required. For personal study only.

✦ Synopsis

A new method of S-parameter extraction from the FDTD in analyses of microstrip circuits is proposed. It only uses the Ex-field component parts in three selected trans¨erse cross sections of the transmission line under approach. The reflection coefficient is extracted from a single run of the FDTD. Neither prior knowledge of the line nor any computation of the deri¨ati¨e of the electric and magnetic fields is needed. The proposed new method is directly applicable to analyses of the discontinuities of microwa¨e transmission circuits.

πŸ“œ SIMILAR VOLUMES

A new approach for the extraction of an
A new approach for the extraction of an FET equivalent circuit from measured S parameters
✍ C. van Niekerk; P. Meyer πŸ“‚ Article πŸ“… 1996 πŸ› John Wiley and Sons 🌐 English βš– 333 KB πŸ‘ 2 views

Figure 4 Characteristic impedance and dispersion characteristics for the dominant and first two higher-order modes of shielded dielectric-loaded edge-coupled CBCPW structure with a = 4 mm, h , = h , = 1 mm, E , ~ = 2.22, and other parameters as in Figure 3 choosing appropriate loading and structura