Self-heating characterization and extraction method for thermal resistance and capacitance in HV MOSFETs

✍ Scribed by Anghel, C.; Gillon, R.; Ionescu, A.M.

• Book ID: 118217649
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 162 KB
• Volume: 25
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/led.2003.821669