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Self-Consistent Calculation of the Self-Trapping Barrier for a Hole in the CuO2Plane

✍ Scribed by A. Shelkan; V. Hizhnyakov; E. Sigmund


Book ID
110423906
Publisher
Springer
Year
1998
Tongue
English
Weight
515 KB
Volume
11
Category
Article
ISSN
0896-1107

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Self-consistent calculation of the densi
✍ K.H. Teo; W. Allegretto; J.N. McMullin; H.G. Schmidt-Weinmar πŸ“‚ Article πŸ“… 1990 πŸ› Elsevier Science 🌐 English βš– 402 KB

A new method for the self-consistent calculation of the density-of-states mass of holes in 2-D silicon structures is presented. As an illustration, the two-dimensional dispersion relation E(k x , ky) for the band edges of the holes is calculated for a silicon p-channel inversion layer using the Kohn