✦ LIBER ✦

Self-checking CMOS circuits using pass-transistor logic

✍ Scribed by Kanji Hirabayashi

Book ID: 104635084
Publisher: Springer US
Year: 1991
Tongue: English
Weight: 193 KB
Volume: 2
Category: Article
ISSN: 0923-8174
DOI: 10.1007/bf00133504

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✦ Synopsis

This article presents a new approach to implementing self-checking circuits in CMOS technology. Implementations are made self-checking with respect to a single line stuck-at 0/1 fault. It is assumed that stuck faults at a common gate of neighboring PMOS and NMOS are not independent and the contact between a PMOS (NMOS) source and a power (ground) line is fault free. Self-checking error checkers for parity, two-rail code, and m-out-ofn code are designed using pass-transistor logic and then verified by fault simulation.

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