Selecting the most reliable design under type-II censored accelerated testing

✍ Scribed by Chang, D.-S.; Huang, D.-Y.; Tseng, S.-T.

• Book ID: 114555117
• Publisher: IEEE
• Year: 1992
• Tongue: English
• Weight: 352 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/24.249592