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Comparison of type-I and type-II accelerated life tests for selecting the most reliable product

โœ Scribed by Sheng-Tsaing Tseng; Chin-Hsiung Hsu

Book ID
114555279
Publisher
IEEE
Year
1994
Tongue
English
Weight
514 KB
Volume
43
Category
Article
ISSN
0018-9529

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๐Ÿ“œ SIMILAR VOLUMES

Optimal design of partially accelerated
Optimal design of partially accelerated life tests for the lognormal distribution under type I censoring
โœ D.S. Bai; S.W. Chung; Y.R. Chun ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 661 KB

This paper considers optimal designs of partially accelerated life tests in which test items are first run simultaneously at use condition for a specified time, and the surviving items are then run at accelerated condition until a predetermined censoring time. For items having lognormally distribute