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Secondary cracking at grain boundaries in silicon thin films

✍ Scribed by Jin Chen; Yu Qiao

Book ID: 113896952
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 268 KB
Volume: 57
Category: Article
ISSN: 1359-6462
DOI: 10.1016/j.scriptamat.2007.08.037

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