Scope for X-ray examination of packing-defect distributions in fcc crystals
β Scribed by S. V. Rushchits; D. A. Mirzaev; V. L. Il'ichev
- Book ID
- 112426171
- Publisher
- Springer
- Year
- 1983
- Tongue
- English
- Weight
- 240 KB
- Volume
- 26
- Category
- Article
- ISSN
- 1573-9228
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## Abstract Using the modified method of limited Xβray topographs the distribution of defects along the silicon dendritic thickness was investigated. It is found that there are two dislocation sources in the given crystals, one of which acts near the surface and generates the loopβshaped dislocatio
## Abstract Analytical expressions for coherent and diffuse scattering intensities with account for imperfections in all the crystals of doubleβ and tripleβcrystal diffractometers (DCD and TCD) have been derived from the generalized dynamical theory of Xβray scattering in real single crystals which