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Dynamical effects of X-ray scattering in laue geometry for Si crystals with structure defects

✍ Scribed by Olekhnovich, N. M. ;Karpei, A. L.


Publisher
John Wiley and Sons
Year
1984
Tongue
English
Weight
391 KB
Volume
82
Category
Article
ISSN
0031-8965

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## Abstract Analytical expressions for coherent and diffuse scattering intensities with account for imperfections in all the crystals of double‐ and triple‐crystal diffractometers (DCD and TCD) have been derived from the generalized dynamical theory of X‐ray scattering in real single crystals which