Dynamical Oscillations of X-Ray Integrated Intensity in Laue Diffraction and Their Temperature Dependences for Si Dislocation Crystals

✍ Scribed by Olekhnovich, N. M. ;Karpei, A. L. ;Skidan, V. M. ;Puzenkova, L. D.

• Publisher: John Wiley and Sons
• Year: 1982
• Tongue: English
• Weight: 329 KB
• Volume: 72
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210720204