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Schlieren photography of current filaments in surface-related breakdown of silicon

✍ Scribed by Hankla, B.J.; Williams, P.F.

Book ID: 117862710
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 689 KB
Volume: 24
Category: Article
ISSN: 0093-3813
DOI: 10.1109/27.491694

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