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Scanning tunnelling microscopy studies of growth morphology in highly epitaxial c-axis oriented Pt thin film on (0 0 1) SrTiO3

✍ Scribed by X Chen; T Garrent; S.W Liu; Y Lin; Q.Y Zhang; C Dong; C.L Chen

Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 333 KB
Volume: 542
Category: Article
ISSN: 0039-6028
DOI: 10.1016/s0039-6028(03)00954-3

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✦ Synopsis

A noble metal Pt thin film was successfully grown on (0 0 1) SrTiO 3 substrate by using a DC-sputtering technique. The surface morphology and growth features of the as-grown Pt films were investigated by scanning tunnelling microscopy. Growth conditions, such as pre-sputtering, deposition ambience, and oxygen ratio are found to greatly affect the orientation, the crystallinity, and the epitaxial behavior of Pt films on (0 0 1) SrTiO 3 . Single-crystalline Pt films have been achieved by introducing a few percentage oxygen into the sputtering ambient. The in-plane-relationship of the caxis oriented Pt thin films on (0 0 1) SrTiO 3 was determined to be (0 0 1) Pt k(0 0 1) SrTiO 3 and [0 0 1] Pt k[0 0 1] SrTiO 3 . Oxygen in the sputtering ambient was found to be a key factor to achieve the epitaxial Pt films.

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Scanning tunnelling microscopy studies of growth morphology in highly epitaxial c-axis oriented Pt thin film on (0&#xa0;0&#xa0;1) SrTiO3

✦ Synopsis

Scanning tunnelling microscopy studies of growth morphology in highly epitaxial c-axis oriented Pt thin film on (0 0 1) SrTiO3