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Scanning tunneling microscopy of the Si-SiO2structure: the use of feedback fault conditions in surface studies

✍ Scribed by V. M. Kornilov; A. N. Lachinov; B. A. Loginov; V. A. Bespalov


Book ID
111444363
Publisher
Springer
Year
2009
Tongue
English
Weight
144 KB
Volume
43
Category
Article
ISSN
1063-7826

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