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Scanning Tunneling Microscopy of Cubic Silicon Carbide Surfaces

✍ Scribed by Chia-Seng Chang; Nan-Jiu Zheng; Ignatius S. T. Tsong; Yu-Cheng Wang; Robert F. Davis


Book ID
110824778
Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
608 KB
Volume
73
Category
Article
ISSN
0002-7820

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Amplitude and phase of high frequency surface acoustic wave (SAW) fields are investigated by a novel scanning tunnehg microscopy technique. The gap voltage is modulated at a slightly detuned high frequency. Due to the nonlinearity of the tunneling process a frequency mixing appears. For scanned area