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Scanning tunneling microscopy of nanocrystalline silicon surfaces

✍ Scribed by J.K. Gimzewski; A. Humbert; D.W. Pohl; S. Vepĕk

Publisher: Elsevier Science
Year: 1986
Weight: 42 KB
Volume: 168
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(86)90501-3

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