𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Scanning probe microscopy of single Au ion implants in Si

✍ Scribed by L. Vines; E. Monakhov; K. Maknys; B.G. Svensson; J. Jensen; A. Hallén; A. Yu. Kuznetsov

Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
409 KB
Volume
26
Category
Article
ISSN
0928-4931

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Demonstration of gating action in atomic
Demonstration of gating action in atomically controlled Si:P nanodots defined by scanning probe microscopy
✍ Frank J. Rueß; Giordano Scappucci; Martin Füchsle; Wilson Pok; Andreas Fuhrer; D 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 774 KB

We study the low temperature electrical characteristics of planar, highly phosphorus-doped nanodots. The dots are defined by lithographically patterning an atomically flat, hydrogenated Si(1 0 0):H surface using a scanning-tunneling-microscope (STM), phosphorus d-doping and low temperature molecular