Scanning force microscopy of surface damage created by fast C60 cluster ions in CaF2 and LaF3 single crystals

✍ Scribed by A.S. El-Said; F. Aumayr; S. Della-Negra; R. Neumann; K. Schwartz; M. Toulemonde; C. Trautmann; K.-O. Voss

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 433 KB
• Volume: 256
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2006.12.025