Scanning probe microscopy of organics, an update
โ Scribed by Jane E. Frommer
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 521 KB
- Volume
- 273
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
The force-displacement profiles of four well-characterized materials that represent both soft/hard and plastic/brittle materials have been obtained using a novel nanoindentation technique. Flat surfaces of acetaminophen, potassium chloride, sucrose, and sodium stearate were prepared by melting or re
A semicrystalline segmented polyamide has been used as model system to investigate the morphology of thick and thin solvent cast ยฎlms. Tapping atomic force microscopy (AFM) with height and phase detection was used to resolve the ribbon-like crystals near the surface. Methods are described for obtain