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Nanometer resolution of crystalline morphology using scanning probe microscopy

✍ Scribed by Sauer, Bryan B; McLean, R Scott; Thomas, Richard R

Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
476 KB
Volume
49
Category
Article
ISSN
0959-8103

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✦ Synopsis

A semicrystalline segmented polyamide has been used as model system to investigate the morphology of thick and thin solvent cast ®lms. Tapping atomic force microscopy (AFM) with height and phase detection was used to resolve the ribbon-like crystals near the surface. Methods are described for obtaining nanometer resolution of domains. Much thinner and smaller crystals were imaged in ®lms approximately 30 nm thick due to crystallization under constrained environments. The results illustrate the danger of casting ultrathin ®lms where the thickness is found to have a large in¯uence on the ®nal morphology. The results also show that details of crystallite organization in spherulites can be characterized by lower resolution phase data, and illustrate the advantages of the phase data for polymer ®lms with long-range roughness.

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