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High-Resolution Imaging of Nanostructured Si/SiO2 Substrates and Cell Monolayers Using Scanning Electrochemical Microscopy

✍ Scribed by Stefan Bergner; Peter Palatzky; Joachim Wegener; Frank-Michael Matysik


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
264 KB
Volume
23
Category
Article
ISSN
1040-0397

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