𝔖 Bobbio Scriptorium
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Scanning probe microscopy of polymeric methyltrioxorhenium

✍ Scribed by Dr. Mike R. Mattner; Prof. Wolfgang A. Herrmann; Rüdiger Berger; Dr. Christoph Gerber; Dr. Jim K. Gimzewski


Publisher
John Wiley and Sons
Year
1996
Tongue
English
Weight
705 KB
Volume
8
Category
Article
ISSN
0935-9648

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## Abstract Scanning probe microscopy methods allow the investigation of a variety of sample surface properties on a nanometer scale, even down to single molecules. As molecular electronics advance, the characterization of electrical properties becomes more and more important. In both research and