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Scanning nonlinear dielectric microscopy with nanometer resolution

โœ Scribed by Cho, Yasuo; Kazuta, Satoshi; Matsuura, Kaori


Book ID
120933071
Publisher
American Institute of Physics
Year
1999
Tongue
English
Weight
598 KB
Volume
75
Category
Article
ISSN
0003-6951

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A semicrystalline segmented polyamide has been used as model system to investigate the morphology of thick and thin solvent cast ยฎlms. Tapping atomic force microscopy (AFM) with height and phase detection was used to resolve the ribbon-like crystals near the surface. Methods are described for obtain