Direct Domain Wall Thickness Measurement Using Scanning Nonlinear Dielectric Microscopy

✍ Scribed by Cho, Y.; Matsuura, K.; Valanoor, N.; Ramesh, R.

• Book ID: 115515535
• Publisher: Taylor and Francis Group
• Year: 2003
• Tongue: English
• Weight: 436 KB
• Volume: 292
• Category: Article
• ISSN: 0015-0193
• DOI: 10.1080/00150190390222961