Scanning Ion Conductance Microscopy : Imaging Technique Integrating Shear Force Distance Control

✍ Scribed by Matthias Böcker; Tilman E. Schäffer

• Book ID: 102866582
• Publisher: Wiley (John Wiley & Sons)
• Year: 2007
• Weight: 668 KB
• Volume: 9
• Category: Article
• ISSN: 1439-4243
• DOI: 10.1002/imic.200790143

✦ Synopsis

Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-force-controlled SICM is presented and a new imaging mode that significantly improves image quality is discussed.