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Nanobiotechnology II || Shear-Force-Controlled Scanning Ion Conductance Microscopy

✍ Scribed by Mirkin, Chad A.; Niemeyer, Christof M.


Book ID
101399393
Publisher
Wiley-VCH Verlag GmbH & Co. KGaA
Year
2007
Weight
243 KB
Category
Article
ISBN
3527316736

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Scanning Ion Conductance Microscopy : Im
✍ Matthias BΓΆcker; Tilman E. SchΓ€ffer πŸ“‚ Article πŸ“… 2007 πŸ› Wiley (John Wiley & Sons) βš– 668 KB

Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductan