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High resolution imaging using scanning ion conductance microscopy with improved distance feedback control

✍ Scribed by Chao Li; Nicholas Johnson; Victor Ostanin; Andrew Shevchuk; Liming Ying; Yuri Korchev; David Klenerman

Book ID
118492617
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
936 KB
Volume
18
Category
Article
ISSN
1002-0071

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Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductan