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Imaging of Thermal Conductivity with Sub-Micrometer Resolution Using Scanning Thermal Microscopy

✍ Scribed by Y. Q. Gu; X. L. Ruan; L. Han; D. Z. Zhu; X. Y. Sun

Book ID: 110347607
Publisher: Springer
Year: 2002
Tongue: English
Weight: 230 KB
Volume: 23
Category: Article
ISSN: 0195-928X
DOI: 10.1023/a:1016350321991

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