✦ LIBER ✦
Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues
✍ Scribed by Stéphane Grauby; Amine Salhi; Luis-David Patino Lopez; Wilfrid Claeys; Benoît Charlot; Stefan Dilhaire
- Book ID
- 108210714
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 747 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0026-2714
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