Scanning electron microscopy, x-ray microanalysis and analytical electron microscopy a laboratory workbook. Charles E. Lyman, Dale E. Newbury, Joseph I. Goldstein, David B. Williams, Alton D. Romig, Jr., John T. Armstron, Patrick Echlin, Charles E. Fiori, David C. Joy, Eric Lifshin, Klaus-Ruediger Peters Plenum Press, New York (1992) ISBN: 0-306-435918; $32.50

✍ Scribed by C. Gordon Cleaver

• Book ID: 112188372
• Publisher: Hindawi Limited
• Year: 1993
• Tongue: English
• Weight: 163 KB
• Volume: 15
• Category: Article
• ISSN: 0161-0457
• DOI: 10.1002/sca.4950150110