Scanning electron microscopy, X-ray microanalysis, and analytical electron microscopy. A laboratory workbook, By Charles E. Lyman, Dale E. Newbury, Joseph I. Goldstein, David B. Williams, Alton D. Romig Jr., John T. Armstrong, Patrick Echlin, Charles E. F

✍ Scribed by Mochel, M. E. ;Dümler, I. ;Greene, A. ;Eades, J. A.

• Book ID: 102334141
• Publisher: Wiley (John Wiley & Sons)
• Year: 1991
• Tongue: English
• Weight: 124 KB
• Volume: 19
• Category: Article
• ISSN: 0741-0581
• DOI: 10.1002/jemt.1060190312