Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || X-Ray Microanalysis in the AEM

✍ Scribed by Lyman, Charles E.; Goldstein, Joseph I.; Romig, Alton D.; Echlin, Patrick; Joy, David C.; Newbury, Dale E.; Williams, David B.; Armstrong, John T.; Fiori, Charles E.; Lifshin, Eric; Peters, Klaus-Ruediger

• Book ID: 120608454
• Publisher: Springer US
• Year: 1990
• Weight: 1011 KB
• Category: Article
• ISBN: 1461306353
• DOI: 10.1007/978-1-4613-0635-1_25