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Scanning Electron Microscopy and X-Ray Microanalysis . J. Goldstein, D. Newbury, D. Joy, C, Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael. Kluwer Academic, Plenum Publishers, New York; 2003, 688 pages (Hardback, $75.00) ISBN 0-306-47292-9

✍ Scribed by Burany, Sandy (author)

Book ID: 120938061
Publisher: Cambridge University Press (CUP)
Year: 2003
Tongue: English
Weight: 40 KB
Volume: 9
Category: Article
ISSN: 1431-9276
DOI: 10.1017/S1431927603030617

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