Scanning Electron Microscopy and X-Ray Microanalysis: Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael (Eds.), Kluwer Academic/Plenum Publishers, New York/Boston/Dordrecht/London/Moscow, 2003, pp. 689 (Hardbound. Price: €76.50/US $75.00/GB £48.00)

✍ Scribed by Gerhard Eisenbeis

• Book ID: 108210249
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 35 KB
• Volume: 34
• Category: Article
• ISSN: 0968-4328
• DOI: 10.1016/j.micron.2003.08.001