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Scaling analysis of Fe-implanted Ge surfaces using atomic force microscopy

✍ Scribed by R. Venugopal; B. Sundaravel; I.H. Wilson; J.B. Xu

Book ID
114340805
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
267 KB
Volume
48
Category
Article
ISSN
1044-5803

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