Microbial Surfaces Investigated Using Atomic Force Microscopy
β Scribed by Anastassia V. Bolshakova; Olga I. Kiselyova; Igor V. Yaminsky
- Book ID
- 109387092
- Publisher
- American Institute of Chemical Engineers
- Year
- 2004
- Tongue
- English
- Weight
- 622 KB
- Volume
- 20
- Category
- Article
- ISSN
- 8756-7938
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
The origin of contrast in atomic force microscopy (AFM) lies in the probe's response to forces between itself and the sample. These forces most commonly result from changes in height as the tip is scanned over the surface, but can also originate in properties inherent in the sample. These have been
## Ε½ . Ε½ . Ε½ . Topography and frictional properties of freshly cleaved surfaces of ferroelastic crystals: K Na SeO KNSe , and NH LiH SO 3 42 4 3 44 Ε½ . Ε½ . Ε½ . Ε½ . ALHS , and Gd MoO GMO were investigated by combined scanning and friction force microscopy FFM under ambient and 2 43 Ε½ . UHV conditi