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Samarium silicide formation by ultrathin film reaction

✍ Scribed by P.J. Godowski; F. Ørskov; M. Christiansen; J. Onsgaard


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
364 KB
Volume
205
Category
Article
ISSN
0040-6090

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Ytterbium silicide (YbSi 1.7 ) thin films were prepared on single-crystal Si (111) wafers and fused silica plates by solid-phase crystallization. The structure and phase transformations of the films were analysed by X-ray diffraction and Rutherford backscattering spectroscopy (RBS). The electrical p