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[RTP 9th International Conference on Advanced Thermal Processing of Semiconductors. RTP 2001 - Anchorage, AK, USA (25-29 Sept. 2001)] 9th International Conference on Advanced Thermal Processing of Semiconductors, RTP 2001 - Effects of radiative properties of surfaces on radiometric temperature measurement

✍ Scribed by Zhou, Y.H.; Zhang, Z.M.; DeWitt, D.P.; Tsai, B.K.

Book ID: 121786261
Publisher: RTP
Year: 2001
Weight: 723 KB
Category: Article
DOI: 10.1109/RTP.2001.1013764

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