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Roughness in GaN/InGaN films and multilayers determined with Rutherford backscattering

✍ Scribed by N.P. Barradas; E. Alves; S. Pereira; V.V. Shvartsman; A.L. Kholkin; E. Pereira; K.P. O'Donnell; C. Liu; C.J. Deatcher; I.M. Watson; M. Mayer

Book ID: 113822656
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 960 KB
Volume: 217
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2003.11.009

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