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Determination of thicknesses of different layers of a multilayer thin film with the aid of total external and mirror reflection of X-rays: P A Bezirganyan et al, Izv Akad Nauk Armen SSR, Fizika, 5 (2), 1970, 107–112 (in Russian)


Publisher
Elsevier Science
Year
1971
Tongue
English
Weight
147 KB
Volume
21
Category
Article
ISSN
0042-207X

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