✦ LIBER ✦
Diffusion of In atoms in InGaN ultra-thin films during post-growth thermal annealing by high-resolution Rutherford backscattering spectrometry
✍ Scribed by H. Sakuta; Y. Kawano; Y. Yamanaka; S. Kurai; T. Taguchi
- Publisher
- John Wiley and Sons
- Year
- 2005
- Tongue
- English
- Weight
- 127 KB
- Volume
- 2
- Category
- Article
- ISSN
- 1862-6351
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