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Role of oxygen vacancies in anodic TiO2 thin films

✍ Scribed by Nacir Tit; J.W. Halley; Marek T. Michalewicz; H. Shore

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
529 KB
Volume
65-66
Category
Article
ISSN
0169-4332

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Local film thickness and photoresponse o
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Auger depth profiling was used to determine the local film thickness of a thin anodic oxide grown on a polycrystalline Ti substrate. The oxide thickness was studied as a function of substrate crystallography and final growth voltage. These results were related to local photocurrent measurements obta