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Robust detection of sensor faults by means of a statistical test

✍ Scribed by Đani Juričić; Mina Žele


Book ID
108307212
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
280 KB
Volume
38
Category
Article
ISSN
0005-1098

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A characterization of robust test-pairs
✍ Sreejit Chakravarty 📂 Article 📅 1991 🏛 Springer US 🌐 English ⚖ 790 KB

Tests for stuck-open faults in static CMOS circuits consist of a sequence of two input vectors. Such test-pairs may be invalidated by delays in the circuit. Test-pairs that are not invalidated by delays in the circuit are known as robust test-pairs. We present a six-valued logic system f~ = {0, 1, r