𝔖 Bobbio Scriptorium
✦   LIBER   ✦

A characterization of robust test-pairs for stuck-open faults

✍ Scribed by Sreejit Chakravarty

Book ID
104636282
Publisher
Springer US
Year
1991
Tongue
English
Weight
790 KB
Volume
1
Category
Article
ISSN
0923-8174

No coin nor oath required. For personal study only.

✦ Synopsis

Tests for stuck-open faults in static CMOS circuits consist of a sequence of two input vectors. Such test-pairs may be invalidated by delays in the circuit. Test-pairs that are not invalidated by delays in the circuit are known as robust test-pairs. We present a six-valued logic system f~ = {0, 1, r, f, Oh, lh}. We show how f~ differs from a number of other logic systems that have been proposed for test generation. This logic system abstracts the important aspects of the transition behavior of the circuit, on application of an input pair, that is necessary to characterize robust test-pairs for stuck-open faults. This characterization of robust test-pairs is used to derive: (i) an algorithm for determining if a given test-pair is a robust test-pair for a given stuck-open fault or not; and (ii) a simplified algorithm for computing a robust test-pair for a stuck-open fault. The resulting algorithm for computing robust tests for stuck-open faults can be implemented by minor modifications to test generation algorithms for stuck-at faults.

πŸ“œ SIMILAR VOLUMES

A more powerful robust sib-pair test of
A more powerful robust sib-pair test of linkage for quantitative traits
✍ C. I. Amos; R. C. Elston; A. F. Wilson; J. E. Bailey-Wilson; D. C. Rao πŸ“‚ Article πŸ“… 1989 πŸ› John Wiley and Sons 🌐 English βš– 860 KB

A more powerful robust test for linkage is developed from the methodology of Haseman and Elston [Behav Genet 2(1):3-19, 19721. This new robust test uses weighted least-squares (WLS) methods to detect linkage between a quantitative trait and a polymorphic marker. For comparison, the characteristics o

Power and robustness of a score test for
Power and robustness of a score test for linkage analysis of quantitative traits using identity by descent data on sib pairs
✍ Darlene R. Goldstein; Sandrine Dudoit; Terence P. Speed πŸ“‚ Article πŸ“… 2001 πŸ› John Wiley and Sons 🌐 English βš– 137 KB πŸ‘ 2 views

## Abstract Identification of genes involved in complex traits by traditional (lod score) linkage analysis is difficult due to many complicating factors. An unfortunate drawback of non‐parametric procedures in general, though, is their low power to detect genetic effects. Recently, Dudoit and Speed