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Rietveld X-ray diffraction analysis of nanostructured rutile films of titania prepared by pulsed laser deposition

✍ Scribed by S. Murugesan; P. Kuppusami; E. Mohandas

Book ID: 113786825
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 413 KB
Volume: 45
Category: Article
ISSN: 0025-5408
DOI: 10.1016/j.materresbull.2009.09.012

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